 
          3445
        
        
          Technical Committee CFMS /
        
        
          
            Comité technique CFMS
          
        
        
          The uncertainties in E
        
        
          Si
        
        
          can be analyzed by attributing values
        
        
          to E
        
        
          Si
        
        
          variance (V[E
        
        
          Si
        
        
          ]), or by analyzing the sources of
        
        
          uncertainties in the E
        
        
          Si
        
        
          estimations. Considering that the moduli
        
        
          E
        
        
          Si
        
        
          are estimated from CPT, three sources of uncertainty are
        
        
          suggested to be accounted for:
        
        
          (i) The uncertainties due to field measurements (q
        
        
          ci
        
        
          , in this
        
        
          case) – in other words, the sum of inherent soil variability and
        
        
          equipments/measurement procedures errors of CPT. This
        
        
          variance is named V
        
        
          1
        
        
          [E
        
        
          Si
        
        
          ].
        
        
          (ii) The uncertainties due to transformation models – in other
        
        
          words, the empirical correlations used to transform the field
        
        
          measurement results (q
        
        
          ci
        
        
          ) into required design parameters (E
        
        
          Si
        
        
          ).
        
        
          This variance is named V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ];
        
        
          (iii) Statistical uncertainties – due to limited sampling or
        
        
          insufficient representative sampling data in the field. This
        
        
          variance is named V
        
        
          3
        
        
          [E
        
        
          Si
        
        
          ].
        
        
          The sources of uncertainties represented by V
        
        
          1
        
        
          [E
        
        
          Si
        
        
          ] and
        
        
          V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ] are explicit in the E
        
        
          Si
        
        
          x q
        
        
          ci
        
        
          correlations. The typical form
        
        
          of those correlations is:
        
        
          )
        
        
          ] [ .
        
        
          ] [
        
        
          2
        
        
          1
        
        
          
            Ci
          
        
        
          
            average
          
        
        
          
            Si
          
        
        
          
            qV
          
        
        
          
            EV
          
        
        
          
        
        
          
        
        
          ] [ .
        
        
          ] [
        
        
          2
        
        
          2
        
        
          
        
        
          
            V
          
        
        
          
            q EV
          
        
        
          
            average
          
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
        
        
          (13)
        
        
          Observe that in equation (13) two variables can contribute
        
        
          for the uncertainties in E
        
        
          Si
        
        
          estimations, which are: q
        
        
          ci
        
        
          and α. It
        
        
          represents the uncertainties V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] and V
        
        
          2
        
        
          [E
        
        
          S
        
        
          ], as assumed
        
        
          before. The FOSM method is applied to equation (13) to give
        
        
          those sources of uncertainties. Then, V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] e V
        
        
          2
        
        
          [E
        
        
          S
        
        
          ] are:
        
        
          (14
        
        
          in which: V[q
        
        
          ci
        
        
          ] is the sampling variance, calculated using q
        
        
          ci
        
        
          results, of the i
        
        
          th
        
        
          sublayer, and α
        
        
          average
        
        
          is the average or mean α-
        
        
          value, from the choosed correlations.
        
        
          (15)
        
        
          3 EXAMPLE OF APPLICATION
        
        
          in which: V[α] is the variance of α –values, supposed to be
        
        
          equally likely. To evaluate V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ], two or more empirical
        
        
          correlations are needed or, in other case, it results zero.
        
        
          The third source of uncertainties evaluated is due to the
        
        
          representative of sampling data. Assuming that this source of
        
        
          uncertainties is function only of the amount of sampling (size of
        
        
          sample), it can be calculated using the following equation
        
        
          proposed by DeGroot (1986; apud Goldsworthy 2006):
        
        
          (16)
        
        
          in which: V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] is the sampling variance from E
        
        
          S
        
        
          results; n is
        
        
          the number of data obtained from CPT.
        
        
          Thus, the equation to account for all sources of uncertainties
        
        
          on the variance of E
        
        
          Si
        
        
          , of the i
        
        
          th
        
        
          sublayer is:
        
        
          17)
        
        
          (
        
        
          2.5
        
        
          
            Further discussions
          
        
        
          Comparative analysis has showed that the use of the FOSM
        
        
          method underestimates the results for COV[E
        
        
          S
        
        
          ]>30%, reaching
        
        
          up to 50% error when COV[E
        
        
          S
        
        
          ]=100%, due to the non-
        
        
          consideration of the higher orders terms in Taylor‘s series,
        
        
          while SOSM and MCS methods seems to converge,
        
        
          approximately, to same results for all COV[E
        
        
          S
        
        
          ] values.
        
        
          It has been also observed that the depth where the major
        
        
          variance contribution occurs is highly dependent of the E
        
        
          Si
        
        
          values, with strong influence of the I
        
        
          Z
        
        
          distribution factor, from
        
        
          Schmertmann’s (1970). So, the significance of settlement
        
        
          variance contribution (V[ρ
        
        
          i
        
        
          ]), of the i
        
        
          th
        
        
          sublayer, in total
        
        
          settlement variance (V[ρ]) increases as the lower the mean
        
        
          value of E
        
        
          Si
        
        
          and the closer the sublayer is to I
        
        
          Zmax
        
        
          depth.
        
        
          As being simplified methods, is important to summarize the
        
        
          advantages and limitations of its use. Some advantages are:
        
        
          
        
        
          Easy application, trough electronic spreadsheets,
        
        
          without having finite element or advanced calculation
        
        
          software’s.
        
        
          
        
        
          It’s very helpful for giving guidance on the sensivity of
        
        
          design results (Griffiths et al. 2002), outcome from
        
        
          Schmertmann’s (1970) equation, to variations of
        
        
          deformability modulus.
        
        
          
        
        
          Is possible to verify the distribution and the contribution
        
        
          of settlement variances in the sublayers.
        
        
          
        
        
          Despite the non-account for spatial correlations or scale
        
        
          of fluctuation of deformability modulus, the use of
        
        
          Taylor’s methods is not against safety, as observed
        
        
          previously by Gimenes and Hachich (1992).
        
        
          Some limitations are:
        
        
          
        
        
          It’s assumed a single and isolated footing (i.e. there are
        
        
          no interaction among strain bulbs of adjacent footings
        
        
          and no soil-structure interaction effects).
        
        
          
        
        
          In a foundation SLS analysis is necessary to account for
        
        
          the variability of other important parameters as:
        
        
          geometry and load of footings, which were considered
        
        
          constants for the present study.
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
            q E
          
        
        
          .
        
        
          
        
        
          
        
        
          On the use of the proposed methodologies, is recommended
        
        
          that the sublayer thickness be considered as small as possible,
        
        
          so the influence of tendencies in vertical variability is minimal
        
        
          (Campanella et al, 1987). For example, in mechanical CPT with
        
        
          20cm interval data, is indicated to set 20cm for sublayer
        
        
          thickness, so the vertical variability is already considered in the
        
        
          subsoil stratification and is not necessary to detrend the data
        
        
          (since the sublayers are treated as independent from each other).
        
        
          In this case, the evaluated uncertainties in moduli are only from
        
        
          horizontal variability of the sublayers.
        
        
          This section presents an example of application of the SOSM
        
        
          methodology. The case considers one footing with 1600 kN
        
        
          centrally applied load, size of 2,0m x 2,0m, embedded 1,0m
        
        
          below ground surface. The subsoil stratum is showed in figure
        
        
          3. This situation with shallow stratum composed by sand with
        
        
          varied relative density is a typical soil formation from the
        
        
          coastal of Vitoria/ES, influenced by the transgression/regression
        
        
          marine phenomena, occurred in Quaternaries’ period.
        
        
          Figure 3. Subsoil stratum adopted for the example of application.
        
        
          
            n
          
        
        
          
            EV EV
          
        
        
          
            S
          
        
        
          
            S
          
        
        
          ] [
        
        
          ] [
        
        
          1
        
        
          3
        
        
          
        
        
          1,0m
        
        
          4,0m
        
        
          normally consolidated
        
        
          clean sand
        
        
          γ = 19 kN/m³
        
        
          sandy clay fill
        
        
          γ=16 kN/m³
        
        
          B/2
        
        
          20 cm
        
        
          2B
        
        
          A
        
        
          A
        
        
          CPT-01
        
        
          CPT-02
        
        
          CPT-05
        
        
          CPT-03
        
        
          2,0m
        
        
          The results of 06 mechanical cone penetration tests (CPT),
        
        
          with 20 cm limit interval data, are hypothetically assumed to be
        
        
          available in a region around the footing, which is represented by
        
        
          the shown subsoil stratum.
        
        
          For
        
        
          Schmertmann’s (1970) equation, sublayer thickness was
        
        
          set at 20 cm. To account for soil variability in this region is
        
        
          firstly necessary to analyze statistically the CPT data. For each
        
        
          sublayer, q mean and variance values must be calculated.
        
        
          ci
        
        
          After that, deformability modulus has to be estimated for
        
        
          each sublayer, through the adopted(s) empirical correlation(s).
        
        
          Here, it’s assumed the use of only one correlation, which is
        
        
          given by Schmertmann’s (1970):
        
        
          (18)
        
        
          ] [
        
        
          ] [
        
        
          ] [
        
        
          ] [
        
        
          3
        
        
          2
        
        
          1
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            EV EV EV EV
          
        
        
          
        
        
          
        
        
          
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
            q E
          
        
        
          .2
        
        
          
        
        
          CPT-04
        
        
          2,0m
        
        
          CPT-06
        
        
          SECTION A-A
        
        
          PLAN VIEW
        
        
          The uncertainties in E
        
        
          Si
        
        
          can be analyzed by attributing values
        
        
          to E
        
        
          Si
        
        
          variance (V[E
        
        
          Si
        
        
          ]), or by analyzing the sources of
        
        
          uncertainties in the E
        
        
          Si
        
        
          estimations. Considering that the moduli
        
        
          E
        
        
          Si
        
        
          are estimated from CPT, three sources of uncertainty are
        
        
          suggested to be accounted for:
        
        
          (i) The uncertainties due to field measurements (q
        
        
          ci
        
        
          , in this
        
        
          case) – in other words, the sum of inherent soil variability and
        
        
          equipments/measurement procedures errors of CPT. This
        
        
          variance is named V
        
        
          1
        
        
          [E
        
        
          Si
        
        
          ].
        
        
          (ii) The uncertainties due to transformation models – in other
        
        
          words, the empirical correlations used to transform the field
        
        
          measurement results (q
        
        
          ci
        
        
          ) into required design parameters (E
        
        
          Si
        
        
          ).
        
        
          This variance is named V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ];
        
        
          (iii) Statistical uncertainties – due to limited sampling or
        
        
          insufficient representative sampling data in the field. This
        
        
          variance is named V
        
        
          3
        
        
          [E
        
        
          Si
        
        
          ].
        
        
          The sources of uncertainties represented by V
        
        
          1
        
        
          [E
        
        
          Si
        
        
          ] and
        
        
          V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ] are explicit in the E
        
        
          Si
        
        
          x q
        
        
          ci
        
        
          correlations. The typical form
        
        
          of those correlations is:
        
        
          )
        
        
          ] [ .
        
        
          ] [
        
        
          2
        
        
          1
        
        
          
            Ci
          
        
        
          
            average
          
        
        
          
            Si
          
        
        
          
            qV
          
        
        
          
            EV
          
        
        
          
        
        
          
        
        
          ] [ .
        
        
          ] [
        
        
          2
        
        
          2
        
        
          
        
        
          
            V
          
        
        
          
            q EV
          
        
        
          
            average
          
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
        
        
          (13)
        
        
          Observe that in equation (13) two variables can contribute
        
        
          for the uncertainties in E
        
        
          Si
        
        
          estimations, which are: q
        
        
          ci
        
        
          and α. It
        
        
          represents the uncertainties V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] and V
        
        
          2
        
        
          [E
        
        
          S
        
        
          ], as assumed
        
        
          before. The FOSM method is applied to equation (13) to give
        
        
          those sources of uncertainties. Then, V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] e V
        
        
          2
        
        
          [E
        
        
          S
        
        
          ] are:
        
        
          (14
        
        
          in which: V[q
        
        
          ci
        
        
          ] is the sampling variance, calculated using q
        
        
          ci
        
        
          results, of the i
        
        
          th
        
        
          sublayer, and α
        
        
          average
        
        
          is the average or mean α-
        
        
          value, from the choosed correlations.
        
        
          (15)
        
        
          3 EXAMPLE OF APPLICATION
        
        
          in which: V[α] is the variance of α –values, supposed to be
        
        
          equally likely. To evaluate V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ], two or more empirical
        
        
          correlations are needed or, in other case, it results zero.
        
        
          The third source of uncertainties evaluated is due to the
        
        
          representative of sampling data. Assuming that this source of
        
        
          uncertainties is function only of the amount of sampling (size of
        
        
          sample), it can be calculated using the following equation
        
        
          proposed by DeGroot (1986; apud Goldsworthy 2006):
        
        
          (16)
        
        
          in which: V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] is the sampling variance from E
        
        
          S
        
        
          results; n is
        
        
          the number of data obtained from CPT.
        
        
          Thus, the equation to account for all sources of uncertainties
        
        
          on the variance of E
        
        
          Si
        
        
          , of the i
        
        
          th
        
        
          sublayer is:
        
        
          17)
        
        
          (
        
        
          2.5
        
        
          
            Further discussions
          
        
        
          Comparative analysis has showed that the use of the FOSM
        
        
          method underestimates the results for COV[E
        
        
          S
        
        
          ]>30%, reaching
        
        
          up to 50% error when COV[E
        
        
          S
        
        
          ]=100%, due to the non-
        
        
          consideration of the higher orders terms in Taylor‘s series,
        
        
          while SOSM and MCS methods seems to converge,
        
        
          approximately, to same results for all COV[E
        
        
          S
        
        
          ] values.
        
        
          advantages and limitations of its use. Some advantages are:
        
        
          
        
        
          Easy application, trough electronic spreadsheets,
        
        
          without having finite element or advanced calculation
        
        
          software’s.
        
        
          
        
        
          It’s very helpful for giving guidance on the sensivity of
        
        
          design results (Griffiths et al. 2002), outcome from
        
        
          Schmertmann’s (1970) equation, to variations of
        
        
          deformability modulus.
        
        
          
        
        
          Is possible to verify the distribution and the contribution
        
        
          of settlement variances in the sublayers.
        
        
          
        
        
          Despite the non-account for spatial correlations or scale
        
        
          of fluctuation of deformability modulus, the use of
        
        
          Taylor’s methods is not against safety, as observed
        
        
          previously by Gimenes and Hachich (1992).
        
        
          Some limitations are:
        
        
          
        
        
          It’s assumed a single and isolated footing (i.e. there are
        
        
          no interaction among strain bulbs of adjacent footings
        
        
          and no soil-structure interaction effects).
        
        
          
        
        
          In a foundation SLS analysis is necessary to account for
        
        
          the variability of other important parameters as:
        
        
          geometry and load of footings, which were considered
        
        
          constants for the present study.
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
            q E
          
        
        
          .
        
        
          
        
        
          
        
        
          On the use of the proposed methodologies, is recommended
        
        
          that the sublayer thickness be considered as small as possible,
        
        
          so the influence of tendencies in vertical variability is minimal
        
        
          (Campanella et al, 1987). For example, in mechanical CPT with
        
        
          20cm interval data, is indicated to set 20cm for sublayer
        
        
          thickness, so the vertical variability is already considered in the
        
        
          subsoil stratification and is not necessary to detrend the data
        
        
          (since the sublayers are treated as independent from each other).
        
        
          In this case, the evaluated uncertainties in moduli are only from
        
        
          horizontal variability of the sublay rs.
        
        
          This section presents an example of application of the SOSM
        
        
          methodology. The case considers one footing with 1600 kN
        
        
          centrally applied load, size of 2,0m x 2,0m, embedded 1,0m
        
        
          below ground surface. The subsoil stratum is showed in figure
        
        
          3. This situation with shallow stratum composed by sand with
        
        
          varied relative density is a typical soil formation from the
        
        
          coastal of Vitoria/ES, influenced by the transgression/regression
        
        
          marine phenomena, occurred in Quaternaries’ period.
        
        
          Figure 3. Subsoil stratum adopted for the example of application.
        
        
          
            n
          
        
        
          
            EV EV
          
        
        
          
            S
          
        
        
          
            S
          
        
        
          ] [
        
        
          ] [
        
        
          1
        
        
          3
        
        
          
        
        
          1,0m
        
        
          4,0m
        
        
          normally consolidated
        
        
          clean s nd
        
        
          γ = 19 kN/m³
        
        
          sandy clay fill
        
        
          γ=16 kN/m³
        
        
          B/2
        
        
          20 cm
        
        
          2B
        
        
          A
        
        
          A
        
        
          CPT-01
        
        
          CPT-02
        
        
          CPT-05
        
        
          CPT-03
        
        
          2,0m
        
        
          The results of 06 mechanical cone penetration tests (CPT),
        
        
          with 20 cm limit interval data, are hypothetically assumed to be
        
        
          available in a region around the footing, which is represented by
        
        
          the shown subsoil stratum.
        
        
          For
        
        
          Schmertmann’s (1970) equation, sublayer thickness was
        
        
          ] [
        
        
          ] [
        
        
          ] [
        
        
          ] [
        
        
          3
        
        
          2
        
        
          1
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            EV EV EV EV
          
        
        
          
        
        
          
        
        
          
        
        
          CPT-04
        
        
          2,0m
        
        
          CPT-06
        
        
          SECTION A-A
        
        
          PLAN VIEW
        
        
          The uncertainties in E
        
        
          Si
        
        
          can be analyzed by attributing values
        
        
          to E
        
        
          Si
        
        
          variance (V[E
        
        
          Si
        
        
          ]), or by analyzing the sources of
        
        
          uncertainties in the E
        
        
          Si
        
        
          estimations. Considering that the moduli
        
        
          E
        
        
          Si
        
        
          are estimated from CPT, three sources of uncertainty are
        
        
          suggested to be accounted for:
        
        
          (i) The uncertainties due to field measurements (q
        
        
          ci
        
        
          , in this
        
        
          case) – in other words, the sum of inherent soil variability and
        
        
          equipments/measurement procedures errors of CPT. This
        
        
          variance is named V
        
        
          1
        
        
          [E
        
        
          Si
        
        
          ].
        
        
          (ii) The uncertainties due to transformation models – in other
        
        
          words, the empirical correlations used to transform the field
        
        
          measurement results (q
        
        
          ci
        
        
          ) into required design parameters (E
        
        
          Si
        
        
          ).
        
        
          This variance is named V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ];
        
        
          (iii) Statistical uncertainties – due to limited sampling or
        
        
          insufficient representative sampli g data in he f eld. Thi
        
        
          variance is nam d
        
        
          3
        
        
          [E
        
        
          Si
        
        
          ].
        
        
          The sources of uncertainties repre ented by V
        
        
          1
        
        
          [E
        
        
          Si
        
        
          ] and
        
        
          V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ] are explicit in the E
        
        
          Si
        
        
          x q
        
        
          ci
        
        
          correlations. The typical form
        
        
          of tho correlations is:
        
        
          )
        
        
          ] [ .
        
        
          ] [
        
        
          2
        
        
          1
        
        
          
            Ci
          
        
        
          
            averag
          
        
        
          
            Si
          
        
        
          
            qV
          
        
        
          
            EV
          
        
        
          
        
        
          
        
        
          ] [ .
        
        
          ] [
        
        
          2
        
        
          2
        
        
          
        
        
          
            V
          
        
        
          
            q EV
          
        
        
          
            average
          
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
        
        
          (13)
        
        
          Obs rve that in equation (13) two variables can contribute
        
        
          for the uncertainties in E
        
        
          Si
        
        
          estimations, which are: q
        
        
          ci
        
        
          and α. It
        
        
          repre ents the un ertainti s V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] and V
        
        
          2
        
        
          [E
        
        
          S
        
        
          ], as assume
        
        
          b fore. The FOSM method is appli to equation (13) to give
        
        
          tho e sources of unc rtainties. Then, V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] e V
        
        
          2
        
        
          [E
        
        
          S
        
        
          ] are:
        
        
          (14
        
        
          in w ich: V[q
        
        
          ci
        
        
          ] is the sampling variance, calculated us ng q
        
        
          ci
        
        
          results, of the i
        
        
          th
        
        
          sublay r, and α
        
        
          average
        
        
          is the average or mean α-
        
        
          value, from the choosed correlations.
        
        
          ( 5)
        
        
          3 EXAMPLE OF APPLICATION
        
        
          in which: V[α] s the variance of α –values, supposed to be
        
        
          equally lik ly. To evaluate V
        
        
          2
        
        
          [E
        
        
          Si
        
        
          ], t o or more empirical
        
        
          cor lations are needed or, in other case, it results zero.
        
        
          The third source of uncertaint s evaluated is due to th
        
        
          repr sentative of sampli g data. Assuming that this source of
        
        
          uncertainties is function only of the amount of sampling (size of
        
        
          sample), it can be calculated using the following equation
        
        
          proposed by DeGroot (1986; apud Goldsworthy 2006):
        
        
          (16)
        
        
          in which: V
        
        
          1
        
        
          [E
        
        
          S
        
        
          ] is the sampling variance from E
        
        
          S
        
        
          results; n is
        
        
          the number of d ta obtained from CPT.
        
        
          Thus, the equation to account for all sources of uncertainties
        
        
          on the variance of E
        
        
          Si
        
        
          , of the i
        
        
          th
        
        
          sublayer is:
        
        
          17)
        
        
          (
        
        
          2.5
        
        
          
            Further discussions
          
        
        
          Compara ive analy is has showed that the use of the FOSM
        
        
          method underestimates the results for COV[E
        
        
          S
        
        
          ]>30%, reaching
        
        
          up to 50% error when COV[E
        
        
          S
        
        
          ]=100%, due to the non-
        
        
          consideration of the higher orders terms in Taylor‘s series,
        
        
          while SOSM and MCS methods seems to converge,
        
        
          approximately, to same results for all COV[E
        
        
          S
        
        
          ] values.
        
        
          It has been also observed that the depth where the major
        
        
          variance contribution occurs is highly dependent of the E
        
        
          Si
        
        
          values, with strong influence of the I
        
        
          Z
        
        
          distribution factor, from
        
        
          Schmertmann’s (1970). So, the significance of settlement
        
        
          variance contribution (V[ρ
        
        
          i
        
        
          ]), of the i
        
        
          th
        
        
          sublayer, in total
        
        
          settlement variance (V[ρ]) increases as the lower the mean
        
        
          value of E
        
        
          Si
        
        
          and the closer the sublayer is to I
        
        
          Zmax
        
        
          depth.
        
        
          As being simplified methods, is important to summarize the
        
        
          advantages and limitations of its use. Some advantages are:
        
        
          
        
        
          Easy application, trough electronic spreadsheets,
        
        
          without having finite element or advanced calculation
        
        
          software’s.
        
        
          
        
        
          It’s very helpful for giving guidance on the sensivity of
        
        
          design results (Griffiths et al. 2002), outcome from
        
        
          Schmertmann’s (1970) equation, to variations of
        
        
          deformability modulus.
        
        
          
        
        
          Is possible to verify the distribution and the contribution
        
        
          of settlement variances in the sublayers.
        
        
          
        
        
          Despite the non-account for spatial correlations or scale
        
        
          of fluctuation of deformability modulus, the use of
        
        
          Taylor’s methods is not against safety, as observed
        
        
          previously by Gimenes and Hachich (1992).
        
        
          Some limitations are:
        
        
          It’s assumed a single and isolated footing (i.e. there are
        
        
          no interaction among strain bulbs of adjacent footings
        
        
          and no soil-structure interaction effects).
        
        
          n a foundation SLS analysis is ne ssary to account for
        
        
          the va iability of other important paramet rs as:
        
        
          geom try nd load of footings, which were considered
        
        
          constants for the present study.
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
            q E
          
        
        
          .
        
        
          
        
        
          
        
        
          On the use of the proposed me hodol gies, is re mmended
        
        
          that the sublayer thickness be considered as small as possible,
        
        
          so the influence of te den ies in vertical variabili y is minimal
        
        
          (Campanella et al, 1987). For example, in mechanical CPT with
        
        
          20cm interval data, is indicated to set 20cm for sublayer
        
        
          thickness, so the vertical variability is already considered in the
        
        
          subs il strat fication and is not necessary to detrend the data
        
        
          (since the ublayers are treated as ndep ndent from each othe ).
        
        
          In this case, the evaluated uncert ties in moduli are only from
        
        
          horizontal variability of the sublayers.
        
        
          This section presents an example of application of the SOSM
        
        
          methodology. The case considers one footing with 1600 kN
        
        
          centrally applied load, size of 2,0m x 2,0m, embedded 1,0m
        
        
          below ground surface. The subsoil stratum is showed in figure
        
        
          3. This situation with shallow stratum composed by sand with
        
        
          varied relative density is a typical soil formation from the
        
        
          coastal of Vitoria/ES, influenced by the transgression/regression
        
        
          marine phenomena, occurred in Quaternaries’ period.
        
        
          Figure 3. Subsoil stratum adopted for the example of application.
        
        
          
            n
          
        
        
          
            EV EV
          
        
        
          
            S
          
        
        
          
            S
          
        
        
          ] [
        
        
          ] [
        
        
          1
        
        
          3
        
        
          
        
        
          1,0m
        
        
          4,0m
        
        
          normally consolidated
        
        
          clean sand
        
        
          γ = 19 kN/m³
        
        
          sandy clay fill
        
        
          γ=16 kN/m³
        
        
          B/2
        
        
          20 cm
        
        
          2B
        
        
          A
        
        
          A
        
        
          CPT-01
        
        
          CPT-02
        
        
          CPT-05
        
        
          CPT-03
        
        
          2,0m
        
        
          The results of 06 mechanical cone penetration tests (CPT),
        
        
          with 20 cm limit interval data, are hypothetically assumed to be
        
        
          available in a region around the footing, which is represented by
        
        
          the shown subsoil stratum.
        
        
          For
        
        
          Schmertmann’s (1970) equation, sublayer thickness was
        
        
          set at 20 cm. To account for soil variability in this region is
        
        
          firstly necessary to analyze statistically the CPT data. For each
        
        
          sublayer, q mean and variance values must be calculated.
        
        
          ci
        
        
          After that, deformability modulus has to be estimated for
        
        
          each sublayer, through the adopted(s) empirical correlation(s).
        
        
          Here, it’s assumed the use of only one correlation, which is
        
        
          given by Schmertmann’s (1970):
        
        
          (18)
        
        
          ] [
        
        
          ] [
        
        
          ] [
        
        
          ] [
        
        
          3
        
        
          2
        
        
          1
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            Si
          
        
        
          
            EV EV EV EV
          
        
        
          
        
        
          
        
        
          
        
        
          
            Ci
          
        
        
          
            Si
          
        
        
          
            q E
          
        
        
          .2
        
        
          
        
        
          CPT-04
        
        
          2,0m
        
        
          CPT-06
        
        
          SECTION A-A
        
        
          PLAN VIEW